Design of Reliable and Self - Repairing SRAM in Nano - scale Technologies using Leakage and Delay Monitoring *

— The inter-die and intra-die variation in process parameters (in particular, threshold voltage (Vt)) result in large number of failures in an SRAM array degrading the design yield. The adaptive repairing techniques, such as adaptive body bias, can be used to improve the design yield. However, to apply adaptive repairing techniques it is necessary to distinguish between the dies from low-Vt process corners and those from the high-Vt corners. In this paper, we propose an online and low-cost technique to effectively separate dies with different inter-die Vt from each other. The proposed technique is based on online monitoring of leakage or delay and it successfully functions even under high random intra-die Vt variation. Using the online leakage (or delay) monitoring and adaptive body bias, we propose the design of a reliable and self-repairable SRAM to reduce the number of parametric failures. The proposed self-repairable SRAM improves the design yield by 5%-40%.